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National Repository of Grey Literature 2 records found  Search took 0.00 seconds. 
Classification of board defects in semiconductor manufacturing
 Jašek, Filip ; Vágner, Martin (referee) ; Dřínovský, Jiří (advisor)
This diploma thesis focuses on detecting defects in semiconductor wafer manufacturing. It explores methods for identifying faulty chips and controlling yield during production. To classify defects machine learning techniques are used. Initially, ResNet18 architecture was used for inference, but low accuracy was attributed to limited input data. Transfer learning with ResNet50v2 was then attempted, resulting in improved metric with different dataset. Hyperparameter tuning and data augmentations were also explored. The study found that autoencoders for data compression during inference increased speed but led to degraded evaluation metrics.
Detailed record
Classification of board defects in semiconductor manufacturing
 Jašek, Filip ; Vágner, Martin (referee) ; Dřínovský, Jiří (advisor)
This diploma thesis focuses on detecting defects in semiconductor wafer manufacturing. It explores methods for identifying faulty chips and controlling yield during production. To classify defects machine learning techniques are used. Initially, ResNet18 architecture was used for inference, but low accuracy was attributed to limited input data. Transfer learning with ResNet50v2 was then attempted, resulting in improved metric with different dataset. Hyperparameter tuning and data augmentations were also explored. The study found that autoencoders for data compression during inference increased speed but led to degraded evaluation metrics.
Detailed record

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